SciAps X-50 XRF Analyser

SciAps X-50 XRF Analyser – is a compact, rugged, and cost-effective handheld XRF analyser designed for users who need dependable elemental analysis in the field without the added cost of light-element detection. Featuring a PiN-diode detector and streamlined software, the X-50 delivers accurate results for alloys, metals, soils, ores, and environmental samples — making it an ideal tool for industrial inspections, recycling operations, mining, and regulatory screening.

Key Features & Advantages

Proven PiN-diode detection

The X-50 uses a robust PiN detector that provides reliable measurement of transition metals and heavy elements. While its count rate and spectral resolution are lower than SDD-based models, it performs exceptionally well in applications where light elements (Mg, Al, Si) are not required.

Compact, lightweight, field-ready design

Built for portability and long workdays in challenging environments, the instrument features a balanced grip, ruggedized housing, and easy one-hand operation.

Broad application coverage

Suitable for:

•  Alloy identification and basic sorting
• Stainless steels, copper alloys, nickel alloys
• Heavy metals in soil, ores, and industrial materials
•  Environmental screening and regulatory compliance checks
•  Scrap metal recycling and quality control
•  Mineral exploration where heavy-element mapping is sufficient

Intuitive Android-based interface

The X-50 operates on a fully integrated Android platform with:

•  High-resolution touchscreen
• On-board camera for sample photo documentation
• WiFi, Bluetooth, and GPS connectivity
• Seamless data-transfer to PC software (SciAps Profile Builder)

Flexible calibration options

Supports:

• Fundamental Parameters (FP)
• Compton normalization (EPA 6200)
• Factory or custom empirical calibrations

These allow adaptation to a wide range of metals, matrices, and regulatory requirements.

Typical Detection Capabilities

Strong detection performance for:

• Fe, Cr, Ni, Mn, Cu, Zn
• Pb, Cd, As, Sb, Hg
• Rare heavy elements down to ppm-level (depending on matrix and acquisition time)

Moderate detection for:

• Elements between Ca and Ti (varies by sample type)

Not suitable for detecting:

• Light elements: Mg, Al, Si, P, S

Since the PiN detector does not capture low-energy X-rays effectively, the X-50 is not appropriate for applications requiring precise quantification of these light elements.

Recommended Industries & Applications

• Scrap and Recycling: Alloy sorting, incoming material verification
• Metal Fabrication: Positive Material Identification (PMI)
• Mining & Exploration: Ore screening, grade control (heavy elements)
• Environmental / Soil Testing: Lead, arsenic, and heavy-metal screening
• Construction & Safety Compliance: Coatings, welds, and structural materials
• Education & Research: Entry-level XRF for academic labs

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Why Choose the SciAps X-50?

Choose the X-50 if you need:

• A budget-friendly handheld XRF
• Reliable performance for medium–heavy element analysis
• A lightweight, easy-to-use device with modern software
• A practical tool for field screening rather than advanced laboratory-grade spectroscopy
• A durable, portable instrument backed by SciAps’ global support and calibration tools

The X-50 provides a solid balance of performance, portability, and affordability — making it a dependable choice for everyday industrial and environmental XRF testing.